Analog Circuit Design

November 20th, 2009

This volume of Analog Circuit Design concentrates on three topics: MOST RF Circuits; Bandpass Delta-Sigma Converters; Translinear Circuits. The book comprises six papers on each topic written by internationally recognised experts. These papers are tutorial in nature and together make a substantial contribution to improving the design of analog circuits. The book is divided into three parts: Part I, MOST Continue reading Analog Circuit Design

Handbook of Electric Power Calculations

November 19th, 2009

A bestselling calculations handbook that offers electric power engineers and technicians essential, step-by-step procedures for solving a wide array of electric power problems. This edition introduces a complete electronic book on CD-ROM with over 100 live calculations–90% of the book’s calculations. Updated to reflect the new National Electric Code advances in transformer and motors; and the new system design and operating procedures in the electric utility industry prompted by deregulation.
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Mikrocontroller und Mikroprozessoren

November 19th, 2009

Uwe Brinkschulte, Theo Ungerer, “Mikrocontroller und Mikroprozessoren”
Springer | 2007 | ISBN: 3540468013 | 450 pages | PDF | 5,1 MB

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IC Mask Design: Essential Layout Techniques

November 16th, 2009

IC Mask Design: Essential Layout Techniques
McGraw-Hill Professional | ISBN: 0071389962 | May 24, 2002 | PDF | 457 pages | 10 MB

Integrated Circuit Mask Design teaches integrated circuit (IC) processes, mask design techniques, and fundamental device concepts in everyday language. It develops ideas from the ground up, building complex concepts out of simple ones, constantly reinforcing what has been taught with examples, self-tests and sidebars covering the motivation behind the material covered.
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Reliability & Failure of Electronic Materials & Devices

March 31st, 2009

Milton Ohring, “Reliability & Failure of Electronic Materials & Devices”
Academic Press | 1998 | ISBN: 0125249853 | 692 pages | PDF | 29,1 MB
Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data.

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